首页> 外文OA文献 >Loss-of-function variants of SETD5 cause intellectual disability and the core phenotype of microdeletion 3p25.3 syndrome.
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Loss-of-function variants of SETD5 cause intellectual disability and the core phenotype of microdeletion 3p25.3 syndrome.

机译:功能丧失的SETD5变异导致智力障碍和微缺失3p25.3综合征的核心表型。

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摘要

Intellectual disability (ID) has an estimated prevalence of 2-3%. Due to its extreme heterogeneity, the genetic basis of ID remains elusive in many cases. Recently, whole exome sequencing (WES) studies revealed that a large proportion of sporadic cases are caused by de novo gene variants. To identify further genes involved in ID, we performed WES in 250 patients with unexplained ID and their unaffected parents and included exomes of 51 previously sequenced child-parents trios in the analysis. Exome analysis revealed de novo intragenic variants in SET domain-containing 5 (SETD5) in two patients. One patient carried a nonsense variant, and the other an 81 bp deletion located across a splice-donor site. Chromosomal microarray diagnostics further identified four de novo non-recurrent microdeletions encompassing SETD5. CRISPR/Cas9 mutation modelling of the two intragenic variants demonstrated nonsense-mediated decay of the resulting transcripts, pointing to a loss-of-function (LoF) and haploinsufficiency as the common disease-causing mechanism of intragenic SETD5 sequence variants and SETD5-containing microdeletions. In silico domain prediction of SETD5, a predicted SET domain-containing histone methyltransferase (HMT), substantiated the presence of a SET domain and identified a novel putative PHD domain, strengthening a functional link to well-known histone-modifying ID genes. All six patients presented with ID and certain facial dysmorphisms, suggesting that SETD5 sequence variants contribute substantially to the microdeletion 3p25.3 phenotype. The present report of two SETD5 LoF variants in 301 patients demonstrates a prevalence of 0.7% and thus SETD5 variants as a relatively frequent cause of ID.
机译:智力障碍(ID)的患病率估计为2-3%。由于其极高的异质性,ID的遗传基础在许多情况下仍然难以捉摸。最近,全外显子组测序(WES)研究表明,大部分散发病例是由de novo基因变异引起的。为了鉴定涉及ID的其他基因,我们对250例原因不明的ID及其未受影响的父母进行了WES,并在分析中包括了51个先前测序的儿童-父母三重奏的外显子组。外显子组分析显示两名患者中含有SET结构域5(SETD5)的从头基因内变异。一名患者携带无意义的变异,另一名患者位于剪接供体位点的81 bp缺失。染色体微阵列诊断进一步鉴定了涵盖SETD5的四个从头非复发性微缺失。两种基因内变异的CRISPR / Cas9突变模型显示了无义介导的转录产物的衰变,表明功能缺失(LoF)和单倍体不足是基因内SETD5序列变异和含有SETD5的微缺失的常见致病机制。在SETD5的计算机域预测中,一个预测的包含SET域的组蛋白甲基转移酶(HMT)证实了SET域的存在并鉴定了一个新的推定的PHD域,从而增强了与众所周知的组蛋白修饰ID基因的功能性联系。所有6例患者均出现ID和某些面部畸形,提示SETD5序列变异对微缺失3p25.3表型有重要贡献。本报告在301位患者中出现了两个SETD5 LoF变异体,显示患病率为0.7%,因此SETD5变异体是ID的相对常见原因。

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